TY  - RPRT
TI  - Density functional theory study of effect of NO annealing on electronic structure and carrier-scattering property of 4H-SiC(0001)/SiO$_2$ interface
AU  - Nahoto Funaki
AU  - Kosei Sugiyama
AU  - Mitsuharu Uemoto
AU  - Tomoya Ono
PY  - 2025
UR  - https://arxiv.org/abs/2506.23912
ID  - 2506.23912
ER  -