TY  - RPRT
TI  - Reliable Magnetometry for Antiferromagnets and Thin Films: Correcting Substrate Artifacts in Mn3Sn/MgO Systems
AU  - Katarzyna Gas
AU  - Maciej Sawicki
PY  - 2025
DO  - 10.1103/wvr7-9s6r
UR  - https://arxiv.org/abs/2507.01385
ID  - 2507.01385
ER  -