TY  - RPRT
TI  - Geometric Modeling of a Line of Alternating Disclinations: Application to Grain Boundaries in Graphene
AU  - A. M. de M. Carvalho
AU  - C. Furtado
PY  - 2025
UR  - https://arxiv.org/abs/2507.03796
ID  - 2507.03796
ER  -