@misc{indiciae3646e387cf0b,
  title = {A Comprehensive Survey for Real-World Industrial Defect Detection: Challenges, Approaches, and Prospects},
  author = {Yuqi Cheng and Yunkang Cao and Haiming Yao and Wei Luo and Cheng Jiang and Hui Zhang and Weiming Shen},
  year = {2025},
  url = {https://arxiv.org/abs/2507.13378},
  note = {Source identifier: 2507.13378}
}