TY  - RPRT
TI  - Multi-Sampling-Frequency Naturalness MOS Prediction Using Self-Supervised Learning Model with Sampling-Frequency-Independent Layer
AU  - Go Nishikawa
AU  - Wataru Nakata
AU  - Yuki Saito
AU  - Kanami Imamura
AU  - Hiroshi Saruwatari
AU  - Tomohiko Nakamura
PY  - 2025
UR  - https://arxiv.org/abs/2507.14647
ID  - 2507.14647
ER  -