TY  - RPRT
TI  - YATE: The Role of Test Repair in LLM-Based Unit Test Generation
AU  - Michael Konstantinou
AU  - Renzo Degiovanni
AU  - Jie M. Zhang
AU  - Mark Harman
AU  - Mike Papadakis
PY  - 2025
UR  - https://arxiv.org/abs/2507.18316
ID  - 2507.18316
ER  -