TY  - RPRT
TI  - Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices
AU  - Leo Guo
AU  - Adwait Inamdar
AU  - Willem D. van Driel
AU  - GuoQi Zhang
PY  - 2025
UR  - https://arxiv.org/abs/2507.19663
ID  - 2507.19663
ER  -