@misc{indiciae05fd2e49c0e4,
  title = {Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology},
  author = {Thomas H. Swift and Alberto Gomez-Saiz and Virginia N. Ciriano-Tejel and David F. Wise and Grayson M. Noah and John J. L. Morton and M. Fernando Gonzalez-Zalba and Mark A. I. Johnson},
  year = {2025},
  url = {https://arxiv.org/abs/2507.21306},
  note = {Source identifier: 2507.21306}
}