@misc{indiciae8c41adbaa6bb,
  title = {The Effect of Pattern Quality on Measurements of Stress Heterogeneity and Geometrically Necessary Dislocation Density by High-Angular Resolution Electron Backscatter Diffraction},
  author = {Harison S. Wiesman and David Wallis},
  year = {2025},
  url = {https://arxiv.org/abs/2507.22745},
  note = {Source identifier: 2507.22745}
}