TY  - RPRT
TI  - The Effect of Pattern Quality on Measurements of Stress Heterogeneity and Geometrically Necessary Dislocation Density by High-Angular Resolution Electron Backscatter Diffraction
AU  - Harison S. Wiesman
AU  - David Wallis
PY  - 2025
UR  - https://arxiv.org/abs/2507.22745
ID  - 2507.22745
ER  -