TY  - RPRT
TI  - Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures
AU  - Megan Powell
AU  - Euan Parry
AU  - Conor McGeough
AU  - Alexander Zotov
AU  - Alessandro Rossi
PY  - 2026
DO  - 10.1088/2633-4356/ae5da8
UR  - https://arxiv.org/abs/2507.23109
ID  - 2507.23109
ER  -