TY  - RPRT
TI  - Theory of Electronic Nematic Criticality Constrained by Elastic Compatibility
AU  - W. Joe Meese
AU  - Rafael M. Fernandes
PY  - 2026
DO  - 10.1103/4hqt-9n6g
UR  - https://arxiv.org/abs/2507.23754
ID  - 2507.23754
ER  -