@misc{indiciae51f1a5a2f70a,
  title = {A Practical Finite Element Approach for Simulating Dynamic Crack Growth in Cu/Ultra Low-k Interconnect Structures},
  author = {Yuxi Xie and Ethan J. Wu and Lu Xu and Jimmy Perez and Shaofan Li},
  year = {2025},
  url = {https://arxiv.org/abs/2508.00193},
  note = {Source identifier: 2508.00193}
}