TY  - RPRT
TI  - A Practical Finite Element Approach for Simulating Dynamic Crack Growth in Cu/Ultra Low-k Interconnect Structures
AU  - Yuxi Xie
AU  - Ethan J. Wu
AU  - Lu Xu
AU  - Jimmy Perez
AU  - Shaofan Li
PY  - 2025
UR  - https://arxiv.org/abs/2508.00193
ID  - 2508.00193
ER  -