TY  - RPRT
TI  - A Novel Methodology of Visualizing Orthorhombic Phase Uniformity in Ferroelectric Hf0.5Zr0.5O2 Devices Using Piezoresponse Force Microscopy
AU  - Wei-Cheng Peng
AU  - Hsien-Yang Liu
AU  - Cheng-Yu Yu
AU  - Artur Useinov
AU  - Tian-Li Wu
PY  - 2025
UR  - https://arxiv.org/abs/2508.01707
ID  - 2508.01707
ER  -