TY  - RPRT
TI  - Endpoint slippage analysis in the presence of impedance rise and loss of active material
AU  - Marco-Tulio F. Rodrigues
PY  - 2025
DO  - 10.1149/1945-7111/ae32b0
UR  - https://arxiv.org/abs/2508.02878
ID  - 2508.02878
ER  -