TY  - RPRT
TI  - Impact of Ge substrate Thicknesses and Epitaxy Growth Conditions on the Optical and Material Properties of Ge- and GaAs-based VCSELs
AU  - Wenhan Dong
AU  - Zeyu Wan
AU  - Yun-Cheng Yang
AU  - Chao-Hsin Wu
AU  - Yiwen Zhang
AU  - Rui-Tao Wen
AU  - Guangrui Xia
PY  - 2025
UR  - https://arxiv.org/abs/2508.06777
ID  - 2508.06777
ER  -