TY  - RPRT
TI  - Breakdown and polarization contrasts in ferroelectric devices observed by operando laser-based photoemission electron microscopy with the AC/DC electrical characterization system
AU  - Hirokazu Fujiwara
AU  - Yuki Itoya
AU  - Masaharu Kobayashi
AU  - Cédric Bareille
AU  - Toshiyuki Taniuchi
PY  - 2025
UR  - https://arxiv.org/abs/2508.07698
ID  - 2508.07698
ER  -