@misc{indiciaeeeb76a40fc1e,
  title = {Electronic localization on the structural inhomogeneities formed due to Bi and Te deficiency in the MBE grown films of AFM topological insulator MnBi2Te4: Evidence from spectroscopic ellipsometry and infrared studies},
  author = {N. N. Kovaleva and D. Chvostova and T. N. Fursova and A. V. Muratov and S. I. Bozhko and Yu. A. Aleshchenko and A. Dejneka and D. V. Ishchenko and O. E. Tereshchenko and K. I. Kugel},
  year = {2025},
  url = {https://arxiv.org/abs/2508.10440},
  note = {Source identifier: 2508.10440}
}