TY  - RPRT
TI  - Electronic localization on the structural inhomogeneities formed due to Bi and Te deficiency in the MBE grown films of AFM topological insulator MnBi2Te4: Evidence from spectroscopic ellipsometry and infrared studies
AU  - N. N. Kovaleva
AU  - D. Chvostova
AU  - T. N. Fursova
AU  - A. V. Muratov
AU  - S. I. Bozhko
AU  - Yu. A. Aleshchenko
AU  - A. Dejneka
AU  - D. V. Ishchenko
AU  - O. E. Tereshchenko
AU  - K. I. Kugel
PY  - 2025
UR  - https://arxiv.org/abs/2508.10440
ID  - 2508.10440
ER  -