TY  - RPRT
TI  - Logical Error Rates for the Surface Code Under a Mixed Coherent and Stochastic Circuit-Level Noise Model Inspired by Trapped Ions
AU  - Tyler LeBlond
AU  - Peter Groszkowski
AU  - Justin G. Lietz
AU  - Christopher M. Seck
AU  - Ryan S. Bennink
PY  - 2025
DO  - 10.1103/ktb3-gcxr
UR  - https://arxiv.org/abs/2508.14227
ID  - 2508.14227
ER  -