TY  - RPRT
TI  - On the nature and charge state of the X-Defect, a radiation-induced Silicon defect with field-enhanced charge carrier emission
AU  - Niels Sorgenfrei
AU  - Yana Gurimskaya
AU  - Anja Himmerlich
AU  - Michael Moll
AU  - Ulrich Parzefall
AU  - Ioana Pintilie
AU  - Joern Schwandt
PY  - 2025
DO  - 10.1016/j.nima.2025.171133
UR  - https://arxiv.org/abs/2508.16197
ID  - 2508.16197
ER  -