@misc{indiciae35e51a47004f,
  title = {afspm: A Framework for Manufacturer-Agnostic Automation in Scanning Probe Microscopy},
  author = {Nicholas J. Sullivan and Julio J. Valdés and Kirk H. Bevan and Peter Grutter},
  year = {2025},
  doi = {10.3762/bjnano.17.45},
  url = {https://arxiv.org/abs/2509.00113},
  note = {Source identifier: 2509.00113}
}