TY  - RPRT
TI  - Two-level system loss characterization of NbTi superconducting resonators on Si/SiO2 substrates
AU  - Bongkeon Kim
AU  - Yong-Joo Doh
PY  - 2025
UR  - https://arxiv.org/abs/2509.01447
ID  - 2509.01447
ER  -