TY  - RPRT
TI  - Optical characterization of deep level defects in n-type Al$_x$In$_y$Ga$_{1-x-y}$P for development of solid-state photomultiplier analogs
AU  - Andrew M. Armstrong
AU  - Evan M. Anderson
AU  - Lisa N. Caravello
AU  - Eduardo Garcia
AU  - Joseph P. Klesko
AU  - Samuel D. Hawkins
AU  - Eric A. Shaner
AU  - John F. Klem
AU  - Aaron J. Muhowski
PY  - 2025
DO  - 10.1088/1361-6641/ae1b37
UR  - https://arxiv.org/abs/2509.02880
ID  - 2509.02880
ER  -