TY  - RPRT
TI  - Thickness-Induced Topological Phase Transition Investigated by Helicity Dependent Photocurrent in $α$-Sn/CdTe(110)
AU  - Tengfei Liu
AU  - Xiyu Hong
AU  - Zhe Li
AU  - Shenzhong Chen
AU  - Leyi Li
AU  - Xin-Yi Tang
AU  - Shuying Cheng
AU  - Yunfeng Lai
AU  - Yonghai Chen
AU  - Zhu Diao
AU  - Ke He
AU  - Qi-kun Xue
AU  - Jinling Yu
PY  - 2025
UR  - https://arxiv.org/abs/2509.04042
ID  - 2509.04042
ER  -