TY  - RPRT
TI  - Optomechanical method for characterizing thermal transport across van der Waals interfaces
AU  - Hanqing Liu
AU  - Saurabh Lodha
AU  - Herre S. J. van der Zant
AU  - Peter G. Steeneken
AU  - Gerard J. Verbiest
PY  - 2025
UR  - https://arxiv.org/abs/2509.04786
ID  - 2509.04786
ER  -