TY  - RPRT
TI  - Superellipsoid modeling of wire-laser additive manufacturing defects measured by digital image correlation
AU  - Khalil Hachem
AU  - Yann Quinsat
AU  - Christophe Tournier
AU  - Nicolas Beraud
PY  - 2025
UR  - https://arxiv.org/abs/2509.17545
ID  - 2509.17545
ER  -