@misc{indiciae61f6cf93cc29,
  title = {Are Foundation Models Ready for Industrial Defect Recognition? A Reality Check on Real-World Data},
  author = {Simon Baeuerle and Pratik Khanna and Nils Friederich and Angelo Jovin Yamachui Sitcheu and Damir Shakirov and Andreas Steimer and Ralf Mikut},
  year = {2025},
  url = {https://arxiv.org/abs/2509.20479},
  note = {Source identifier: 2509.20479}
}