TY  - RPRT
TI  - Are Foundation Models Ready for Industrial Defect Recognition? A Reality Check on Real-World Data
AU  - Simon Baeuerle
AU  - Pratik Khanna
AU  - Nils Friederich
AU  - Angelo Jovin Yamachui Sitcheu
AU  - Damir Shakirov
AU  - Andreas Steimer
AU  - Ralf Mikut
PY  - 2025
UR  - https://arxiv.org/abs/2509.20479
ID  - 2509.20479
ER  -