TY  - RPRT
TI  - No One-Size-Fits-All: A Workload-Driven Characterization of Bit-Parallel vs. Bit-Serial Data Layouts for Processing-using-Memory
AU  - Jingyao Zhang
AU  - Elaheh Sadredini
PY  - 2025
UR  - https://arxiv.org/abs/2509.22980
ID  - 2509.22980
ER  -