TY  - RPRT
TI  - Electropolishing-Induced Topographic Defects in Niobium: Insights and Implications for Superconducting Radio Frequency Applications
AU  - Oleksandr Hryhorenko
AU  - Anne-Marie Valente-Feliciano
AU  - Eric M. Lechner
PY  - 2026
DO  - 10.1088/1361-6668/ae40a3
UR  - https://arxiv.org/abs/2509.25423
ID  - 2509.25423
ER  -