@misc{indiciaeca731ff878ec,
  title = {Automated Defect Detection for Mass-Produced Electronic Components Based on YOLO Object Detection Models},
  author = {Wei-Lung Mao and Chun-Chi Wang and Po-Heng Chou and Yen-Ting Liu},
  year = {2025},
  doi = {10.1109/jsen.2024.3418618},
  url = {https://arxiv.org/abs/2510.01914},
  note = {Source identifier: 2510.01914}
}