TY  - RPRT
TI  - Automated Defect Detection for Mass-Produced Electronic Components Based on YOLO Object Detection Models
AU  - Wei-Lung Mao
AU  - Chun-Chi Wang
AU  - Po-Heng Chou
AU  - Yen-Ting Liu
PY  - 2025
DO  - 10.1109/jsen.2024.3418618
UR  - https://arxiv.org/abs/2510.01914
ID  - 2510.01914
ER  -