TY  - RPRT
TI  - Investigation of the Effect of Thermal-Induced Atomic Motion on the Conductance of Copper Thin Films
AU  - Sihe Chen
AU  - Kevin Batzinger
AU  - Manuel Smeu
PY  - 2026
UR  - https://arxiv.org/abs/2510.05349
ID  - 2510.05349
ER  -