TY  - RPRT
TI  - Electron Lateral Trapping Induced by Non-Uniform Thickness in Solid Neon Layers
AU  - Toshiaki Kanai
AU  - Chuanwei Zhang
PY  - 2025
UR  - https://arxiv.org/abs/2510.10351
ID  - 2510.10351
ER  -