@misc{indiciaee9e59c3aef0a,
  title = {Cryogenic temperature dependence and hysteresis of surface-trap-induced gate leakage in GaN high-electron-mobility transistors},
  author = {Ching-Yang Pan and Shi-Kai Lin and Yu-An Chen and Pei-hsun Jiang},
  year = {2025},
  url = {https://arxiv.org/abs/2510.14456},
  note = {Source identifier: 2510.14456}
}