TY  - RPRT
TI  - Cryogenic temperature dependence and hysteresis of surface-trap-induced gate leakage in GaN high-electron-mobility transistors
AU  - Ching-Yang Pan
AU  - Shi-Kai Lin
AU  - Yu-An Chen
AU  - Pei-hsun Jiang
PY  - 2025
UR  - https://arxiv.org/abs/2510.14456
ID  - 2510.14456
ER  -