@misc{indiciaecfe1706b0a7d,
  title = {Unveiling Retention Loss Mechanism in FeFETs with Gate-side Interlayer by Decoupling Trapped Charges and Ferroelectric Polarization},
  author = {Runhao Han and Tao Hu and Jia Yang and Saifei Dai and Yajing Ding and Mingkai Bai and Xianzhou Shao and Junshuai Chai and Hao Xu and Qing Luo and Wenwu Wang and Tianchun Ye and Xiaolei Wang},
  year = {2025},
  url = {https://arxiv.org/abs/2510.15275},
  note = {Source identifier: 2510.15275}
}