TY  - RPRT
TI  - Dielectric Deposition Enhanced Crystallization in Atomic-Layer-Deposited Indium Oxide Transistors Achieving High Gated-Hall Mobility Exceeding 100 cm2/Vs at Room Temperature
AU  - Chen Wang
AU  - Kai Jiang
AU  - Jinxiu Zhao
AU  - Ziheng Wang
AU  - Guilei Wang
AU  - Chao Zhao
AU  - Mengwei Si
PY  - 2025
UR  - https://arxiv.org/abs/2510.15358
ID  - 2510.15358
ER  -