@misc{indiciae5d6aa2f648a1,
  title = {Fault Cause Identification across Manufacturing Lines through Ontology-Guided and Process-Aware FMEA Graph Learning with LLMs},
  author = {Sho Okazaki and Kohei Kaminishi and Takuma Fujiu and Yusheng Wang and Manu Sasidharan and Jun Ota},
  year = {2026},
  url = {https://arxiv.org/abs/2510.15428},
  note = {Source identifier: 2510.15428}
}