TY  - RPRT
TI  - Fault Cause Identification across Manufacturing Lines through Ontology-Guided and Process-Aware FMEA Graph Learning with LLMs
AU  - Sho Okazaki
AU  - Kohei Kaminishi
AU  - Takuma Fujiu
AU  - Yusheng Wang
AU  - Manu Sasidharan
AU  - Jun Ota
PY  - 2026
UR  - https://arxiv.org/abs/2510.15428
ID  - 2510.15428
ER  -