@misc{indiciaef98e5f8c37bc,
  title = {Robust Material Properties in Epitaxial In\$\_2\$Te\$\_3\$ Thin Films Across Varying Thicknesses},
  author = {Maximilian Buchta and Felix Hoff and Lucas Bothe and Niklas Penner and Christoph Ringkamp and Thomas Schmidt and Timo Veslin and Ka Lei Mak and Jonathan Frank and Dasol Kim and Matthias Wuttig},
  year = {2025},
  doi = {10.1002/smll.202508738},
  url = {https://arxiv.org/abs/2510.18449},
  note = {Source identifier: 2510.18449}
}