TY  - RPRT
TI  - Exploring "Many in Few" and "Few in Many" Properties in Long-Tailed, Highly-Imbalanced IC Defect Classification
AU  - Hao-Chiang Shao
AU  - Chun-Hao Chang
AU  - Yu-Hsien Lin
AU  - Chia-Wen Lin
AU  - Shao-Yun Fang
AU  - Yan-Hsiu Liu
PY  - 2025
UR  - https://arxiv.org/abs/2510.19463
ID  - 2510.19463
ER  -