@misc{indiciae089a744a3f18,
  title = {Multi-Task Deep Learning for Surface Metrology},
  author = {D. Kucharski and A. Gaska and T. Kowaluk and K. Stepien and M. Repalska and B. Gapinski and M. Wieczorowski and M. Nawotka and P. Sobecki and P. Sosinowski and J. Tomasik and A. Wojtowicz},
  year = {2025},
  doi = {10.3390/s25247471},
  url = {https://arxiv.org/abs/2510.20339},
  note = {Source identifier: 2510.20339}
}