TY  - RPRT
TI  - Thickness dependent rare earth segregation in magnetron deposited NdCo$_{4.6}$ thin films studied by Xray reflectivity and Hard Xray photoemission
AU  - J. Díaz
AU  - J. Rodríguez-Fernández
AU  - J. Rubio-Zuazo
PY  - 2026
UR  - https://arxiv.org/abs/2510.23852
ID  - 2510.23852
ER  -