TY  - RPRT
TI  - Delay Time Characterization on FPGA: A Low Nonlinearity, Picosecond Resolution Time-to-Digital Converter on 16-nm FPGA using Bin Sequence Calibration
AU  - Sunwoo Park
AU  - Byungkwon Park
AU  - Eunsung Kim
AU  - Jiwon Yune
AU  - Seungho Han
AU  - Seunggo Nam
PY  - 2025
UR  - https://arxiv.org/abs/2511.05583
ID  - 2511.05583
ER  -