@misc{indiciae14ca3e902eef,
  title = {SinSEMI: A One-Shot Image Generation Model and Data-Efficient Evaluation Framework for Semiconductor Inspection Equipment},
  author = {ChunLiang Wu and Xiaochun Li},
  year = {2025},
  url = {https://arxiv.org/abs/2511.06740},
  note = {Source identifier: 2511.06740}
}