TY  - RPRT
TI  - SinSEMI: A One-Shot Image Generation Model and Data-Efficient Evaluation Framework for Semiconductor Inspection Equipment
AU  - ChunLiang Wu
AU  - Xiaochun Li
PY  - 2025
UR  - https://arxiv.org/abs/2511.06740
ID  - 2511.06740
ER  -