TY  - RPRT
TI  - In-vacuum surface flashover of SiN, AlN, and etched SiO2 thin films at micrometre scales
AU  - Vijay Kumar
AU  - Martin Siegele-Brown
AU  - Matthew Aylett
AU  - Sebastian Weidt
AU  - Winfried Karl Hensinger
PY  - 2025
UR  - https://arxiv.org/abs/2511.10528
ID  - 2511.10528
ER  -